|
These comments from engineers who are actively involved in embedded chip projects indicate that the problems are enormous.
* * * * * * * * *
In reality, testing will potentially take more time and cost more than the discovery phase. . . .
Unfortunately there are so few people who understand how many of these complex chip based devices have been designed. . . .
Destructive Tests - Are where an item of equipment is taken off line and tested for a range of dates errors. No errors are found. However when the device is put back into live operation failures immediately occur! The reason is that some tests may accidentally over write areas of programmable chips and controllers.
|